There are three basic types of microscopy:
1) Optical Microscopy
Compound Microscopes, which have a useful magnification of up to 1000-2000X and Stereo Microscopes with magnifications of up to ~100X.
2) EM-Electron Microscopy
TEM-Transmission Electron Microscopes, which have a useful magnification of up to 50,000,000X; SEM-Scanning Electron Microscopes with magnifications of up to 250,000X, and STEM-Scanning Tunneling Electron Microscopes with magnifications of up to 10,000,000X.
3) SPM-Scanning Probe Microscopy
AFM-Atomic Force Microscopes can magnify surface features up to 100,000,000X, and STM-Scanning Tunneling Microscopes can provide depth resolutions of 10 picometers (10-12).
Microscopy equipment manufacturers typically provide the maximum allowable vibration levels for their equipment to operate properly. Generic Vibration Criteria curves have also been published to provide Microscopy users with an estimated vibration criteria requirement for their equipment to operate properly.
Bilz has a variety of products to attenuate (reduce) the vibrations that typically effect the performance of surface finish measuring equipment and roundness and cylindricity testers. These products include: 1) Bilz LTH vibration isolated tables with or without a granite table top plate; 2) Bilz LTO vibration isolated tables with or without a Breadboard table top plate; 3) Bilz VITAP-Vibration Isolated Table-Top Platform; 4) BiAir® low natural frequency membrane air springs with self-leveling control system; 5) Bilz Faebi® rubber air springs with or without a self-leveling control system; 6) Bilz EPPC-Electro-Pneumatic Position Control system, and 7) Bilz Active Isolation System-AIS™.
Active Vibration Isolation of STEM-Scanning Tunneling Electron Microscope
AIS Platform – JEOL Electron Microscope
Visitec Scanning Electron Microscope
AIS Lab Table Tunneling Electron Microscope
AIS Lab Table